An etalon-based method for frequency calibration of terahertz time-domain spectrometers (THz TDS)

We present an etalon-based method of calibrating the frequency of terahertz time-domain spectrometers (THz TDS). The method utilizes the etalon effect produced by multiple reflections in non-absorbing wafers or in narrow air–gaps. The technique provides frequency calibration across the measurement b...

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Bibliographic Details
Published inOptics communications Vol. 283; no. 9; pp. 1849 - 1853
Main Authors Naftaly, M., Dudley, R.A., Fletcher, J.R.
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 01.05.2010
Elsevier
Subjects
Calibration
Etalons
Exact sciences and technology
Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
Reflection
Spectrometers
Submillimeter wave, microwave and radiowave spectrometers; magnetic resonance spectrometers, auxiliary equipments and techniques
Uncertainty
Wafers
THz range
Time domain method
Calibration
Submillimeter wave spectroscopy
Multiple reflections
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Summary:We present an etalon-based method of calibrating the frequency of terahertz time-domain spectrometers (THz TDS). The method utilizes the etalon effect produced by multiple reflections in non-absorbing wafers or in narrow air–gaps. The technique provides frequency calibration across the measurement band with uncertainties comparable with the typical THz TDS resolution.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0030-4018
1873-0310
DOI:10.1016/j.optcom.2009.12.025