A New Shipborne Microwave Refractometer for Estimating the Evaporation Flux at the Sea Surface
After a brief description of humidity measurement and a short presentation of methods of microwave refractometry for evaporation flux, a new X-band refractometer system is presented. Based on a new design and a new material for the microwave cravity, it does not need calibration for refractive index...
Saved in:
Published in | Journal of atmospheric and oceanic technology Vol. 18; no. 3; pp. 459 - 475 |
---|---|
Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Boston
American Meteorological Society
01.03.2001
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | After a brief description of humidity measurement and a short presentation of methods of microwave refractometry for evaporation flux, a new X-band refractometer system is presented. Based on a new design and a new material for the microwave cravity, it does not need calibration for refractive index variations because of its reduced thermal time constant. |
---|---|
Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 ObjectType-Article-2 ObjectType-Feature-1 |
ISSN: | 0739-0572 1520-0426 |
DOI: | 10.1175/1520-0426(2001)018<0459:ansmrf>2.0.co;2 |