A New Shipborne Microwave Refractometer for Estimating the Evaporation Flux at the Sea Surface

After a brief description of humidity measurement and a short presentation of methods of microwave refractometry for evaporation flux, a new X-band refractometer system is presented. Based on a new design and a new material for the microwave cravity, it does not need calibration for refractive index...

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Bibliographic Details
Published inJournal of atmospheric and oceanic technology Vol. 18; no. 3; pp. 459 - 475
Main Authors Delahaye, J-Y, Guerin, C, Vinson, J P, Dupuis, H
Format Journal Article
LanguageEnglish
Published Boston American Meteorological Society 01.03.2001
Subjects
Evaporation
Marine
Microwaves
Oceans
Refractometry
Ships
Studies
Weights & measures
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Summary:After a brief description of humidity measurement and a short presentation of methods of microwave refractometry for evaporation flux, a new X-band refractometer system is presented. Based on a new design and a new material for the microwave cravity, it does not need calibration for refractive index variations because of its reduced thermal time constant.
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ISSN:0739-0572
1520-0426
DOI:10.1175/1520-0426(2001)018<0459:ansmrf>2.0.co;2