UTA versus line emission for EUVL: studies on xenon emission at the NIST EBIT

• Published in: Journal of physics. D, Applied physics Vol. 37; no. 23; pp. 3225 - 3232
• Main Authors: Fahy, K, Dunne, P, McKinney, L, O'Sullivan, G, Sokell, E, White, J, Aguilar, A, Pomeroy, J M, Tan, J N, Blagojević, B, LeBigot, E-O, Gillaspy, J D
• Format: Journal Article
• Language: English
• Published: IOP Publishing 07.12.2004
• Subjects: Atomic Physics; Physics; Quantum Physics; UTA; spectrum; EUV; EBIT; xenon; ions; light source

Spectra from xenon ions have been recorded at the NIST electron beam ion trap (EBIT) and the emission into a 2% bandwidth at 13.5 nm arising from 4d - > 5p transitions compared with those from 4d - > 4f and 4p - > 4d transitions in Xe XI and also with that obtained from the unresolved trans...