The effect of growth parameters on the electrical, optical and structural properties of copper phthalocyanine thin films

• Published in: Thin solid films Vol. 347; no. 1; pp. 284 - 288
• Main Authors: Ambily, S., Menon, C.S.
• Format: Journal Article
• Language: English
• Published: Lausanne Elsevier B.V 22.06.1999; Elsevier Science
• Subjects: Activation energy; Annealing; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Cross-disciplinary physics: materials science; rheology; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures; Electronic transport phenomena in thin films and low-dimensional structures; Exact sciences and technology; Infrared and raman spectra and scattering; Low-field transport and mobility; piezoresistance; Materials science; Methods of deposition of films and coatings; film growth and epitaxy; Optical; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation; Other nonmetallic inorganics; Other nonmetals; Phthalocyanines; Physics; Vacuum deposition; Visible and ultraviolet spectra; X-ray diffractogram; X-ray diffractogram; Annealing; Activation energy; Optical; Phthalocyanines; Inorganic compounds; Transition element complexes; Electrical conductivity; Nitrogen heterocycle; Sublimation; Organic ligand; Polycyclic compound; Crystal growth from vapors; Infrared spectra; Experimental study; Fabrication property relation; Thin films; Optical transmission; Metallophthalocyanine; Ultraviolet visible spectrum; Absorption spectra; Microstructure; Thermal annealing; Vacuum deposition; Copper complexes
• ISSN: 0040-6090; 1879-2731
• DOI: 10.1016/S0040-6090(98)01744-1

Vacuum sublimed thin films of copper phthalocyanine are prepared at room temperature and at different substrate temperatures. Post evaporation annealing is done at temperatures of 323, 373, 423 and 473 K. The electrical conductivity and optical absorption spectra of these films are studied. Their structure and structure related microcrystalline grain size are determined.