Time-resolved x-ray diffraction techniques for bulk polycrystalline materials under dynamic loading

• Published in: Review of scientific instruments Vol. 85; no. 9; p. 093901
• Main Authors: Lambert, P K, Hustedt, C J, Vecchio, K S, Huskins, E L, Casem, D T, Gruner, S M, Tate, M W, Philipp, H T, Woll, A R, Purohit, P, Weiss, J T, Kannan, V, Ramesh, K T, Kenesei, P, Okasinski, J S, Almer, J, Zhao, M, Ananiadis, A G, Hufnagel, T C
• Format: Journal Article
• Language: English
• Published: United States 01.09.2014
• Subjects: Elasticity; Lasers, Semiconductor; Materials Testing - instrumentation; Pressure; Stress, Mechanical; Time Factors; Weight-Bearing; X-Ray Diffraction - instrumentation
• ISSN: 1089-7623
• DOI: 10.1063/1.4893881

We have developed two techniques for time-resolved x-ray diffraction from bulk polycrystalline materials during dynamic loading. In the first technique, we synchronize a fast detector with loading of samples at strain rates of ~10(3)-10(4) s(-1) in a compression Kolsky bar (split Hopkinson pressure bar) apparatus to obtain in situ diffraction patterns with exposures as short as 70 ns. This approach employs moderate x-ray energies (10-20 keV) and is well suited to weakly absorbing materials such as magnesium alloys. The second technique is useful for more strongly absorbing materials, and uses high-energy x-rays (86 keV) and a fast shutter synchronized with the Kolsky bar to produce short (~40 μs) pulses timed with the arrival of the strain pulse at the specimen, recording the diffraction pattern on a large-format amorphous silicon detector. For both techniques we present sample data demonstrating the ability of these techniques to characterize elastic strains and polycrystalline texture as a function of time during high-rate deformation.