Atomic pair distribution functions analysis of disordered low-Z materials

Results of high-energy X-ray diffraction experiments coupled to atomic pair distribution function analysis of disordered low- Z materials are presented. Several scientifically and technologically important classes of disordered low- Z materials such as small and large organic molecules, graphitic po...

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Published inPhysical chemistry chemical physics : PCCP Vol. 15; no. 22; pp. 8544 - 8554
Main Authors Petkov, V, Ren, Y, Kabekkodu, S, Murphy, D
Format Journal Article
LanguageEnglish
Published Cambridge Royal Society of Chemistry 14.06.2013
Subjects
Algorithms
Ammonia - chemistry
Boranes - chemistry
Cellulose - chemistry
Condensed matter: structure, mechanical and thermal properties
Dendrimers - chemistry
Exact sciences and technology
Graphite - chemistry
Indomethacin - chemistry
Physics
Povidone - chemistry
Trehalose - chemistry
X-Ray Diffraction
Distribution function
XRD
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Summary:Results of high-energy X-ray diffraction experiments coupled to atomic pair distribution function analysis of disordered low- Z materials are presented. Several scientifically and technologically important classes of disordered low- Z materials such as small and large organic molecules, graphitic powders, polymers and liquids are intentionally explored to certify the technique's performance. Results clearly show that disordered low- Z materials can be well characterized in terms of material's phase identity, relative abundance in mixtures and atomic-scale structure. The demonstrated efficiency of the technique provides the scientific community with much needed confidence to apply it more often than now. Results of high-energy X-ray diffraction experiments coupled to atomic pair distribution function analysis of disordered low- Z materials are presented.
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ISSN:1463-9076
1463-9084
DOI:10.1039/c2cp43378h