A Study on Equal-Thickness Fringes in a Silicon Crystal by Means of an X-ray Video Imaging Device

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Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 10; no. 4; p. 514
Main Authors Hashizume, Hiroo, Ishida, Hidenobu, Kohra, Kazutake
Format Journal Article
LanguageEnglish
Published 01.01.1971
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ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.10.514