Power and Reliability Management of SoCs

• Published in: IEEE transactions on very large scale integration (VLSI) systems Vol. 15; no. 4; pp. 391 - 403
• Main Authors: Rosing, T.S., Mihic, K., De Micheli, G.
• Format: Journal Article
• Language: English
• Published: Piscataway, NJ IEEE 01.04.2007; Institute of Electrical and Electronics Engineers; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Applied sciences; Assessments; Constraint optimization; Design. Technologies. Operation analysis. Testing; Devices; Electronics; Embedded system; Energy consumption; Energy management; Error analysis; Exact sciences and technology; Integrated circuits; Integrated circuits by function (including memories and processors); IP (Internet Protocol); Management; Operating temperature; Optimal control; Optimization; Policies; power consumption; Power system interconnection; Power system management; Power system reliability; reliability management; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Temperature sensors; Transistors; Very large scale integration; Voltage; Die; Processor; Error rate; Transistor; System on a chip; Optimization; Low voltage; Embedded systems; reliability management; Intellectual property core; Power consumption; Interconnection; Optimal control; Optimal solution; Multiple system; Integrated circuit; Reliability

Today's embedded systems integrate multiple IP cores for processing, communication, and sensing on a single die as systems-on-chip (SoCs). Aggressive transistor scaling, decreased voltage margins and increased processor power and temperature have made reliability assessment a much more signific...