Millimeter‐wave diffraction‐loss model based on over‐rooftop propagation measurements

• Published in: ETRI journal Vol. 42; no. 6; pp. 827 - 836
• Main Authors: Kim, Kyung‐Won, Kim, Myung‐Don, Lee, Juyul, Park, Jae‐Joon, Yoon, Young Keun, Chong, Young Jun
• Format: Journal Article
• Language: English
• Published: Electronics and Telecommunications Research Institute (ETRI) 01.12.2020; 한국전자통신연구원
• Subjects: 5G channel; clutter loss; diffraction loss; millimeter‐wave channel; path loss; 전자/정보통신공학

Measuring the diffraction loss for high frequencies, long distances, and large diffraction angles is difficult because of the high path loss. Securing a well‐controlled environment to avoid reflected waves also makes long‐range diffraction measurements challenging. Thus, the prediction of diffractio...