Millimeter‐wave diffraction‐loss model based on over‐rooftop propagation measurements

• Published in: ETRI journal Vol. 42; no. 6; pp. 827 - 836
• Main Authors: Kim, Kyung‐Won, Kim, Myung‐Don, Lee, Juyul, Park, Jae‐Joon, Yoon, Young Keun, Chong, Young Jun
• Format: Journal Article
• Language: English
• Published: Electronics and Telecommunications Research Institute (ETRI) 01.12.2020; 한국전자통신연구원
• Subjects: 5G channel; clutter loss; diffraction loss; millimeter‐wave channel; path loss; 전자/정보통신공학
• ISSN: 1225-6463; 2233-7326
• DOI: 10.4218/etrij.2019-0411

Measuring the diffraction loss for high frequencies, long distances, and large diffraction angles is difficult because of the high path loss. Securing a well‐controlled environment to avoid reflected waves also makes long‐range diffraction measurements challenging. Thus, the prediction of diffraction loss at millimeter‐wave frequency bands relies on theoretical models, such as the knife‐edge diffraction (KED) and geometrical theory of diffraction (GTD) models; however, these models produce different diffraction losses even under the same environment. Our observations revealed that the KED model underestimated the diffraction loss in a large Fresnel‐Kirchhoff diffraction parameter environment. We collected power‐delay profiles when millimeter waves propagated over a building rooftop at millimeter‐wave frequency bands and calculated the diffraction losses from the measurements while eliminating the multipath effects. Comparisons between the measurements and the KED and GTD diffraction‐loss models are shown. Based on the measurements, an approximation model is also proposed that provides a simple method for calculating the diffraction loss using geometrical parameters.