Steady-state properties of lock-on current filaments in GaAs

Collective impact ionization has been used to explain lock-on in semi-insulating GaAs under high-voltage bias. We have used this theory to study some of the steady-state properties of lock-on current filaments. In steady state, the heat gained from the field is exactly compensated by the cooling due...

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Published inIEEE transactions on plasma science Vol. 28; no. 5; pp. 1497 - 1499
Main Authors Kambour, K., Kang, S., Myles, C.W., Hjalmarson, H.P.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.10.2000
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Summary:Collective impact ionization has been used to explain lock-on in semi-insulating GaAs under high-voltage bias. We have used this theory to study some of the steady-state properties of lock-on current filaments. In steady state, the heat gained from the field is exactly compensated by the cooling due to phonon scattering. In the simplest approximation, the carrier distribution approaches a quasi equilibrium Maxwell-Boltzmann distribution. In this report, we examine the validity of this approximation. We find that this approximation leads to a filament carrier density that is much lower than the high density needed to achieve a quasi-equilibrium distribution. Further work on this subject is in progress.
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AC04-94AL85000
SAND2000-0511J
US Department of Energy (US)
ISSN:0093-3813
1939-9375
DOI:10.1109/27.901221