In situ visualization of long-range defect interactions at the edge of melting

Dark-field X-ray microscopy movies reveal how patterns of microscopic defects in bulk aluminum destabilize from 97-99% of melting. Connecting a bulk material’s microscopic defects to its macroscopic properties is an age-old problem in materials science. Long-range interactions between dislocations (...

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Published inScience advances Vol. 7; no. 29; pp. eabe8311 - 1-eabe8311-8
Main Authors Dresselhaus-Marais, Leora E., Winther, Grethe, Howard, Marylesa, Gonzalez, Arnulfo, Breckling, Sean R., Yildirim, Can, Cook, Philip K., Kutsal, Mustafacan, Simons, Hugh, Detlefs, Carsten, Eggert, Jon H., Poulsen, Henning Friis
Format Journal Article
LanguageEnglish
Published United States American Association for the Advancement of Science (AAAS) 01.07.2021
American Association for the Advancement of Science
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Summary:Dark-field X-ray microscopy movies reveal how patterns of microscopic defects in bulk aluminum destabilize from 97-99% of melting. Connecting a bulk material’s microscopic defects to its macroscopic properties is an age-old problem in materials science. Long-range interactions between dislocations (line defects) are known to play a key role in how materials deform or melt, but we lack the tools to connect these dynamics to the macroscopic properties. We introduce time-resolved dark-field x-ray microscopy to directly visualize how dislocations move and interact over hundreds of micrometers deep inside bulk aluminum. With real-time movies, we reveal the thermally activated motion and interactions of dislocations that comprise a boundary and show how weakened binding forces destabilize the structure at 99% of the melting temperature. Connecting dynamics of the microstructure to its stability, we provide important opportunities to guide and validate multiscale models that are yet untested.
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DOE/NV/03624-0762
USDOE Office of Science (SC)
Danish Agency for Science and Higher Education
European Research Council (ERC)
AC52-07NA27344; NA0003624; DOE/NV/03624; LLNL-18-ERD-063; 8144-00002B; ERC-2019-ADV-885022
USDOE National Nuclear Security Administration (NNSA)
Present address: Stanford University, Department of Materials Science & Engineering, 476 Lomita Mall, Stanford, CA 94305, USA.
ISSN:2375-2548
2375-2548
DOI:10.1126/sciadv.abe8311