In situ visualization of long-range defect interactions at the edge of melting
Dark-field X-ray microscopy movies reveal how patterns of microscopic defects in bulk aluminum destabilize from 97-99% of melting. Connecting a bulk material’s microscopic defects to its macroscopic properties is an age-old problem in materials science. Long-range interactions between dislocations (...
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Published in | Science advances Vol. 7; no. 29; pp. eabe8311 - 1-eabe8311-8 |
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Main Authors | , , , , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
United States
American Association for the Advancement of Science (AAAS)
01.07.2021
American Association for the Advancement of Science |
Subjects | |
Online Access | Get full text |
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Summary: | Dark-field X-ray microscopy movies reveal how patterns of microscopic defects in bulk aluminum destabilize from 97-99% of melting.
Connecting a bulk material’s microscopic defects to its macroscopic properties is an age-old problem in materials science. Long-range interactions between dislocations (line defects) are known to play a key role in how materials deform or melt, but we lack the tools to connect these dynamics to the macroscopic properties. We introduce time-resolved dark-field x-ray microscopy to directly visualize how dislocations move and interact over hundreds of micrometers deep inside bulk aluminum. With real-time movies, we reveal the thermally activated motion and interactions of dislocations that comprise a boundary and show how weakened binding forces destabilize the structure at 99% of the melting temperature. Connecting dynamics of the microstructure to its stability, we provide important opportunities to guide and validate multiscale models that are yet untested. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 DOE/NV/03624-0762 USDOE Office of Science (SC) Danish Agency for Science and Higher Education European Research Council (ERC) AC52-07NA27344; NA0003624; DOE/NV/03624; LLNL-18-ERD-063; 8144-00002B; ERC-2019-ADV-885022 USDOE National Nuclear Security Administration (NNSA) Present address: Stanford University, Department of Materials Science & Engineering, 476 Lomita Mall, Stanford, CA 94305, USA. |
ISSN: | 2375-2548 2375-2548 |
DOI: | 10.1126/sciadv.abe8311 |