Cold welding of organic light emitting diode: Interfacial and contact models

This paper presents the results of an analytical and computational study of the contacts and interfacial fracture associated with the cold welding of Organic Light Emitting diodes (OLEDs). The effects of impurities (within the possible interfaces) are explored for contacts and interfacial fracture b...

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Bibliographic Details
Published inAIP advances Vol. 6; no. 6; pp. 065125 - 065125-12
Main Authors Asare, J., Adeniji, S. A., Oyewole, O. K., Agyei-Tuffour, B., Du, J., Arthur, E., Fashina, A. A., Zebaze Kana, M. G., Soboyejo, W. O.
Format Journal Article
LanguageEnglish
Published Melville American Institute of Physics 01.06.2016
AIP Publishing LLC
Subjects
Adhesion
Cold
Cold welding
Impurities
Organic light emitting diodes
Pressure effects
Thickness
Thin films
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Summary:This paper presents the results of an analytical and computational study of the contacts and interfacial fracture associated with the cold welding of Organic Light Emitting diodes (OLEDs). The effects of impurities (within the possible interfaces) are explored for contacts and interfacial fracture between layers that are relevant to model OLEDs. The models are used to study the effects of adhesion, pressure, thin film layer thickness and dust particle modulus (between the contacting surfaces) on contact profiles around impurities between cold-welded thin films. The lift-off stage of thin films (during cold welding) is then modeled as an interfacial fracture process. A combination of adhesion and interfacial fracture theories is used to provide new insights for the design of improved contact and interfacial separation during cold welding. The implications of the results are discussed for the design and fabrication of cold welded OLED structures.
ISSN:2158-3226
2158-3226
DOI:10.1063/1.4955141