A Fourier approach to pulse pile-up in photon-counting x-ray detectors

Purpose: An analytic Fourier approach to predict the expected number of counts registered in a photon-counting detector subject to pulse pile-up for arbitrary photon flux, detector response function, and pulse-shape is presented. The analysis provides a complete forward model for energy-sensitive, p...

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Bibliographic Details
Published inMedical physics (Lancaster) Vol. 43; no. 3; pp. 1295 - 1298
Main Authors Roessl, Ewald, Daerr, Heiner, Proksa, Roland
Format Journal Article
LanguageEnglish
Published United States American Association of Physicists in Medicine 01.03.2016
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Summary:Purpose: An analytic Fourier approach to predict the expected number of counts registered in a photon-counting detector subject to pulse pile-up for arbitrary photon flux, detector response function, and pulse-shape is presented. The analysis provides a complete forward model for energy-sensitive, photon-counting x-ray detectors for spectral computed tomography. Methods: The formalism of the stochastic theory of the expected frequency of level crossings of shot noise processes is applied to the pulse pile-up effect and build on a recently published analytic Fourier representation of the level crossing frequency of shot noise processes with piece-wise continuous kernels with jumps. Results: The general analytic result is validated by a Monte Carlo simulation for pulses of the form g(t) = e −t/τ  (t > 0) and a Gaussian detector response function. The Monte Carlo simulations are in excellent agreement with the analytic predictions of photon counts within the numerical accuracy of the calculations. Conclusions: The phenomenon of pulse pile-up is identified with the level-crossing problem of shot noise processes and an exact, analytic formula for the expected number of counts in energy-sensitive, photon-counting x-ray detectors for arbitrary photon flux, response function, and pulse-shapes is derived. The framework serves as a theoretical foundation for future works on pulse pile-up.
Bibliography:Telephone: +49 (0)40 5078 2965.
ewald.roessl@philips.com
Electronic mail
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ISSN:0094-2405
2473-4209
2473-4209
DOI:10.1118/1.4941743