"Plasmonics" in free space: observation of giant wavevectors, vortices, and energy backflow in superoscillatory optical fields
Evanescent light can be localized at the nanoscale by resonant absorption in a plasmonic nanoparticle or taper or by transmission through a nanohole. However, a conventional lens cannot focus free-space light beyond half of the wavelength . Nevertheless, precisely tailored interference of multiple w...
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Published in | Light, science & applications Vol. 8; no. 1; pp. 2 - 9 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
England
Springer Nature B.V
03.01.2019
Nature Publishing Group UK |
Subjects | |
Online Access | Get full text |
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Summary: | Evanescent light can be localized at the nanoscale by resonant absorption in a plasmonic nanoparticle or taper or by transmission through a nanohole. However, a conventional lens cannot focus free-space light beyond half of the wavelength
. Nevertheless, precisely tailored interference of multiple waves can form a hotspot in free space of an arbitrarily small size, which is known as superoscillation. Here, we report a new type of integrated metasurface interferometry that allows for the first time mapping of fields with a deep subwavelength resolution ~
/100. The findings reveal that an electromagnetic field near the superoscillatory hotspot has many features similar to those found near resonant plasmonic nanoparticles or nanoholes: the hotspots are surrounded by nanoscale phase singularities and zones where the phase of the superoscillatory field changes more than tenfold faster than a free-propagating plane wave. Areas with high local wavevectors are pinned to phase vortices and zones of energy backflow (~
/20 in size) that contribute to tightening of the main focal spot size beyond the Abbe-Rayleigh limit. Our observations reveal some analogy between plasmonic nanofocusing of evanescent waves and superoscillatory nanofocusing of free-space waves and prove the fundamental link between superoscillations and superfocusing, offering new opportunities for nanoscale metrology and imaging. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 2047-7538 2095-5545 2047-7538 |
DOI: | 10.1038/s41377-018-0112-z |