Surface spectrometry using large argon clusters

• Published in: Surface and interface analysis Vol. 45; no. 1; pp. 131 - 133
• Main Authors: Kayser, S., Rading, D., Moellers, R., Kollmer, F., Niehuis, E.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Chichester Blackwell Publishing Ltd 01.01.2013; Wiley; Wiley Subscription Services, Inc
• Subjects: 90° pulsing system; argon cluster; Arn; Atomic, molecular, and ion beam impact and interactions with surfaces; Bin+ Irganox 1010; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Electron and ion emission by liquids and solids; impact phenomena; Exact sciences and technology; fragmentation; Impact phenomena (including electron spectra and sputtering); mass separation by momentum deflection; Physics; polycarbonate; secondary ion yield; surface spectrometry; TOF-SIMS; Irganox 1010; Bi; mass separation by momentum deflection; Momentum; argon cluster; surface spectrometry; Ion beams; Fragmentation; Ar; 90 pulsing system; secondary ion yield; SIMS; Argon; polycarbonate; TOF-SIMS
• ISSN: 0142-2421; 1096-9918
• DOI: 10.1002/sia.4932

Large argon cluster ions can very successfully be applied as primary ion projectiles in SIMS, but until recently, these sources could not be used in combination with conventional TOF‐SIMS systems. The large cluster size distribution limited the possibility to pulse the primary ion beam, which is a prerequisite for high mass resolution surface spectrometry. We developed a unique 90° pulsing system which enables the generation of short primary ion pulses for high mass resolution surface spectrometry. The pulsing system allows the variation of the applied cluster size from 250 to 10000 atoms/cluster. In this contribution, we present and compare data about the influence of the cluster size on the spectra appearance, the fragmentation and the secondary ion yield on different organic sample systems. Copyright © 2012 John Wiley & Sons, Ltd.