Electrical and magnetic properties of tantalum silicon telluride and isostructural compounds
Electrical resistivity, magnetic susceptibility, and lattice parameter measurements for the family of low-dimensional compounds, M 4ZTe 4 (M=Ta, Z=Si, Cr, Fe, Co, and Ni; M=Nb, Z=Si, Fe) are reported. The compounds with Z=Si are diamagnetic and the resistivity curves suggest two phase transitions, p...
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Published in | Materials research bulletin Vol. 29; no. 3; pp. 327 - 336 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
London
Elsevier Ltd
01.03.1994
Amsterdam Elsevier Science |
Subjects | |
Online Access | Get full text |
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Summary: | Electrical resistivity, magnetic susceptibility, and lattice parameter measurements for the family of low-dimensional compounds, M
4ZTe
4 (M=Ta, Z=Si, Cr, Fe, Co, and Ni; M=Nb, Z=Si, Fe) are reported. The compounds with Z=Si are diamagnetic and the resistivity curves suggest two phase transitions, possibly due to charge density waves in these pseudo one-dimensional systems. For Z=Cr, Fe, Co, and Ni the compounds are paramagnetic metals with characteristics of typical intermetallic phases. |
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Bibliography: | FG02-87ER45298 |
ISSN: | 0025-5408 1873-4227 |
DOI: | 10.1016/0025-5408(94)90030-2 |