Scattering parameter estimation accuracy of root-MUSIC algorithms in electromagnetic wave scattering measurements
An application of the superresolution method for the analysis of the electromagnetic scattering data is expected to be effective for experimental verification of the geometrical optics approximation theory and the analysis of multiple paths. There exist many techniques for the superresolution method...
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| Published in | Electronics & communications in Japan. Part 2, Electronics Vol. 79; no. 5; pp. 106 - 115 |
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| Main Authors | , , , |
| Format | Journal Article |
| Language | English |
| Published |
New York
Wiley Subscription Services, Inc., A Wiley Company
1996
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| Subjects | |
| Online Access | Get full text |
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| Summary: | An application of the superresolution method for the analysis of the electromagnetic scattering data is expected to be effective for experimental verification of the geometrical optics approximation theory and the analysis of multiple paths. There exist many techniques for the superresolution method. It is desirable to select an appropriate technique based upon the characteristics of the individual algorithms. Among these techniques, the Root‐MUSIC method has been proposed; this method enables treatment of the signal attenuating exponentially with respect to frequency. In the modified Root‐MUSIC method, arbitrary frequency characteristics can be treated.
This paper investigates the estimation accuracy of the scattering center and the attenuation coefficient when the Root‐MUSIC method and the modified Root‐MUSIC method are applied to the estimation of scattering. With the backscattering data of a conducting sphere, the estimation accuracy of the scattering parameters versus the signal‐to‐noise ratio (SNR) and the number of snapshots is investigated by computer simulation. As a result, it is found that the estimation accuracy of the modified Root‐MUSIC method is much better than that of the conventional Root‐MUSIC method in the case of a low SNR and a small number of snapshots. Experimental results are also reported. |
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| Bibliography: | ArticleID:ECJB4420790511 istex:60B7FD2A35B10D1318C67F82821B8137202DE959 ark:/67375/WNG-FBZBN3MH-Z Received his B.E. degree in Electronics Engineering from Niigata University in 1976 and his M.E. and Dr. of Eng. degrees from Tokyo Institute of Technology, Tokyo, Japan, in 1978 and 1983, respectively. In 1978, he joined the Faculty of Engineering, Niigata University, where at present he is a Professor. From 1988 to 1989, he was a Research Associate at the University of Illinois at Chicago. His interests are in the field of propagation characteristics of electromagnetic wave in lossy medium, radar polarimetry, microwave remote sensing, and imaging. Dr. Yamaguchi is a senior member of IEEE and a member of the Japan Society for Snow Engineering. Received his B.S., M.S., and Ph.D. degrees from Hokkaido University, Sapporo, Japan, in 1988, 1990, and 1993, respectively, all in Electronic Engineering. Since 1993, he has been with Niigata University, where he is currently a Lecturer. His current research involves superresolution techniques, electromagnetic wave measurements, and radar signal processings. Dr. Yamada is a member of the IEEE. Received his B.S. degree from Niigata University, Niigata, Japan, in 1994 in Information Engineering. He is currently in the Master's program in Information Engineering. His current research involves superresolution technique and antenna measurements. Received his B.E. degree in Electrical Engineering from Niigata University, Japan, in 1967 and his M.E. and Ph.D. degrees from Hokkaido University in 1969 and 1972, respectively. In 1972, he joined the staff at Hokkaido University as a Research Associate. In 1978, he was an Associate Professor at Niigata University, where he is presently a Professor. During 1986–1987, he was a Visiting Scholar at the University of California, Berkeley, and at the University of Illinois, Chicago. His research interests include transmission of information, network theory, and graph theory. He is a recipient of the Best Paper Award of I.E.I.C.E. in 1992. Dr. Sengoku is a senior member of IEEE and a member of the Japan Society of Industrial and Applied Mathematics. ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
| ISSN: | 8756-663X 1520-6432 |
| DOI: | 10.1002/ecjb.4420790511 |