Measuring electric field induced subpicometer displacement of step edge ions

We provide unambiguous evidence that the applied electrostatic field displaces step atoms of ionic crystal surfaces by subpicometers in different directions via the measurement of the lateral force interactions by bimodal dynamic force microscopy combined with multiscale theoretical simulations. Suc...

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Published inPhysical review letters Vol. 109; no. 14; p. 146101
Main Authors Kawai, Shigeki, Canova, Filippo Federici, Glatzel, Thilo, Hynninen, Teemu, Meyer, Ernst, Foster, Adam S
Format Journal Article
LanguageEnglish
Published United States 03.10.2012
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Summary:We provide unambiguous evidence that the applied electrostatic field displaces step atoms of ionic crystal surfaces by subpicometers in different directions via the measurement of the lateral force interactions by bimodal dynamic force microscopy combined with multiscale theoretical simulations. Such a small imbalance in the electrostatic interaction of the shifted anion-cation ions leads to an extraordinary long-range feature potential variation and is now detectable with the extreme sensitivity of the bimodal detection.
ISSN:1079-7114
DOI:10.1103/physrevlett.109.146101