Automatic twin statistics from electron backscattered diffraction data

A new computer code has been developed to automatically extract quantitative twin statistics from electron backscatter diffraction data. The new code is an improvement upon previous codes in that it handles materials of any crystal symmetry, type I, Type II and compound twins, and general stress sta...

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Bibliographic Details
Published inJournal of microscopy (Oxford) Vol. 238; no. 3; pp. 218 - 229
Main Authors MARSHALL, P.E, PROUST, G, ROGERS, J.T, MCCABE, R.J
Format Journal Article
LanguageEnglish
Published Oxford, UK Blackwell Publishing Ltd 01.06.2010
Subjects
EBSD
Electron back scatter diffraction
Grain size
Magnesium
Microscopy
Statistics
Twinning
Uranium
Zirconium
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Summary:A new computer code has been developed to automatically extract quantitative twin statistics from electron backscatter diffraction data. The new code is an improvement upon previous codes in that it handles materials of any crystal symmetry, type I, Type II and compound twins, and general stress states. Moreover, accuracy of the results has been greatly improved. In addition, twin statistics including number, area fraction, twin thickness and twinning dependencies on orientation, grain size and neighbourhood effects can be routinely analysed. The new code has been applied to scan data from deformed magnesium, zirconium and uranium, and can potentially be used for any twinning material for which reliable electron backscatter diffraction results can be obtained.
Bibliography:http://dx.doi.org/10.1111/j.1365-2818.2009.03343.x
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ISSN:0022-2720
1365-2818
DOI:10.1111/j.1365-2818.2009.03343.x