Addition Energies and Vibrational Fine Structure Measured in Electromigrated Single-Molecule Junctions Based on an Oligophenylenevinylene Derivative

Transport trough electromigrated molecular junctions that contain an individual thiol end‐capped oligophenylenevinylene molecule has been studied. At low temperatures more than fifteen excitations appear in the differential conductance map (see figure). Their energies agree with energies obtained fr...

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Published inAdvanced materials (Weinheim) Vol. 19; no. 2; pp. 281 - 285
Main Authors Osorio, E. A., O'Neill, K., Stuhr-Hansen, N., Nielsen, O. F., Bjørnholm, T., van der Zant, H. S. J.
Format Journal Article
LanguageEnglish
Published Weinheim WILEY-VCH Verlag 20.01.2007
WILEY‐VCH Verlag
Subjects
Charge transport
Conductivity
Conductivity, electrical
electrical
Molecular electronics
Oligo(phenylene vinylenes)
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Summary:Transport trough electromigrated molecular junctions that contain an individual thiol end‐capped oligophenylenevinylene molecule has been studied. At low temperatures more than fifteen excitations appear in the differential conductance map (see figure). Their energies agree with energies obtained from optical measurements on the same molecule, and are therefore attributed to vibrational modes. Addition energies are consistently an order of magnitude smaller than the optical HOMO–LUMO gap.
Bibliography:Danish Nanotechnology program
Danish Research Councils
ark:/67375/WNG-W0KG3D32-X
EC FP6 funding - No. FP6-2004-IST-003673, CANEL
"Nederlandse Organisatie voor Wetenschappelijk Onderzoek" (NWO)
istex:ACD50FD1CEEBA3D7A1635B8B790D5A51D749F63B
ArticleID:ADMA200601876
The authors thank Hubert Heersche for the initial development of the electromigration method, Jos Seldenthuis for performing the ADF calculations, Christopher Verzijl for earlier work, and Jos Thijssen for general discussions. Financial support was obtained from the Dutch organization for Fundamental Research on Matter (FOM), which is financially supported by the "Nederlandse Organisatie voor Wetenschappelijk Onderzoek" (NWO), from the Danish Research Councils, the Danish Nanotechnology program and from EC FP6 funding (contract no. FP6-2004-IST-003673, CANEL). This publication reflects the views of the authors, and not necessarily those of the EC. The EC is not liable for any use that may be made of the information contained herein.
Dutch organization for Fundamental Research on Matter (FOM)
The authors thank Hubert Heersche for the initial development of the electromigration method, Jos Seldenthuis for performing the ADF calculations, Christopher Verzijl for earlier work, and Jos Thijssen for general discussions. Financial support was obtained from the Dutch organization for Fundamental Research on Matter (FOM), which is financially supported by the “Nederlandse Organisatie voor Wetenschappelijk Onderzoek” (NWO), from the Danish Research Councils, the Danish Nanotechnology program and from EC FP6 funding (contract no. FP6‐2004‐IST‐003673, CANEL). This publication reflects the views of the authors, and not necessarily those of the EC. The EC is not liable for any use that may be made of the information contained herein.
ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
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ISSN:0935-9648
1521-4095
DOI:10.1002/adma.200601876