Organic Materials and Thin-Film Structures for Cross-Point Memory Cells Based on Trapping in Metallic Nanoparticles

Non‐volatile solid‐state memory cells based on composites of metal nanoparticles and polymers are embedded in organic semiconducting host materials. This paper presents data from a wide range of materials and device structures and shows that the switching phenomenon is commonly observed. Non‐volatil...

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Bibliographic Details
Published inAdvanced functional materials Vol. 15; no. 12; pp. 1933 - 1939
Main Authors Bozano, L. D., Kean, B. W., Beinhoff, M., Carter, K. R., Rice, P. M., Scott, J. C.
Format Journal Article
LanguageEnglish
Published Weinheim WILEY-VCH Verlag 01.12.2005
WILEY‐VCH Verlag
Subjects
Data storage
metal
Nanocomposites
Nanoparticles
Nanoparticles, metal
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Summary:Non‐volatile solid‐state memory cells based on composites of metal nanoparticles and polymers are embedded in organic semiconducting host materials. This paper presents data from a wide range of materials and device structures and shows that the switching phenomenon is commonly observed. Non‐volatile solid‐state memory cells based on composites of metal nanoparticles and polymers (see Figure) are embedded in organic semiconducting host materials. This paper presents data from a wide range of materials and device structures and shows that the switching phenomenon is commonly observed. The requirements for switching behavior are surprisingly modest: discrete nanoscopic traps embedded in a wide‐bandgap semiconductor host.
Bibliography:ArticleID:ADFM200500130
ark:/67375/WNG-JG1BNZQG-1
The authors thank C. Rettner for e-beam fabrication, J. E. Frommer for the AFM imaging, V. Deline for SEM, and D. Miller for XPS. We thank Prof. S. Paul, Prof. M. Chhowalla, and Dr. R. Osterbacka for sharing their data before publication. Supporting Information is available online from Wiley InterScience or from the author.
istex:343904F7373E3ABB49D9C5315776609CFCA763DE
The authors thank C. Rettner for e‐beam fabrication, J. E. Frommer for the AFM imaging, V. Deline for SEM, and D. Miller for XPS. We thank Prof. S. Paul, Prof. M. Chhowalla, and Dr. R. Osterbacka for sharing their data before publication. Supporting Information is available online from Wiley InterScience or from the author.
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ISSN:1616-301X
1616-3028
DOI:10.1002/adfm.200500130