Strain-relaxation and critical thickness of epitaxial La1.85Sr0.15CuO4 films

We report the thickness-dependent strain-relaxation behavior and the associated impacts upon the superconductivity in epitaxial La1.85Sr0.15CuO4 films grown on different substrates, which provide a range of strain. We have found that the critical thickness for the onset of superconductivity in La1.8...

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Bibliographic Details
Published inAPL materials Vol. 3; no. 12; pp. 126102 - 126102-6
Main Authors Meyer, T. L., Jiang, L., Park, S., Egami, T., Lee, H. N.
Format Journal Article
LanguageEnglish
Published United States American Institute of Physics (AIP) 01.12.2015
AIP Publishing LLC
Subjects
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
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Summary:We report the thickness-dependent strain-relaxation behavior and the associated impacts upon the superconductivity in epitaxial La1.85Sr0.15CuO4 films grown on different substrates, which provide a range of strain. We have found that the critical thickness for the onset of superconductivity in La1.85Sr0.15CuO4 films is associated with the finite thickness effect and epitaxial strain. In particular, thin films with tensile strain greater than ∼0.25% revealed no superconductivity. We attribute this phenomenon to the inherent formation of oxygen vacancies that can be minimized via strain relaxation.
Bibliography:USDOE Office of Science (SC)
AC05-00OR22725
ISSN:2166-532X
2166-532X
DOI:10.1063/1.4937170