Role of Ga vacancies in enhancing the leakage current of GaN Schottky barrier ultraviolet photodetectors

The leakage current of GaN Schottky barrier ultraviolet photodetectors is investigated. It is found that the photodetectors adopting undoped GaN instead of lightly Si-doped GaN as an active layer show a much lower leakage current even when they have a higher dislocation density. It is also found tha...

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Published inChinese physics B Vol. 19; no. 5; pp. 567 - 570
Main Author 赵德刚 张爽 刘文宝 郝小鹏 江德生 朱建军 刘宗顺 王辉 张书明 杨辉 魏龙
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.05.2010
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ISSN1674-1056
2058-3834
DOI10.1088/1674-1056/19/5/057802

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Summary:The leakage current of GaN Schottky barrier ultraviolet photodetectors is investigated. It is found that the photodetectors adopting undoped GaN instead of lightly Si-doped GaN as an active layer show a much lower leakage current even when they have a higher dislocation density. It is also found that the density of Ca vacancies in undoped GaN is much lower than in Si-doped GaN. The Ga vacancies may enhance tunneling and reduce effective Schottky barrier height, leading to an increase of leakage current. It suggests that when undoped GaN is used as the active layer, it is necessary to reduce the leakage current of GaN Schottky barrier ultraviolet photodetector.
Bibliography:TN311.7
Ga vacancies, MOCVD, GaN, Schottky barrier photodetector
TN23
11-5639/O4
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:1674-1056
2058-3834
DOI:10.1088/1674-1056/19/5/057802