Accelerated Life Testing of Electronic Devices by Atmospheric Particles: Why and How

• Published in: Journal of the Electrochemical Society Vol. 140; no. 11; pp. 3129 - 3134
• Main Authors: Frankenthal, R. P., Siconolfi, D. J., Sinclair, J. D.
• Format: Journal Article
• Language: English
• Published: Pennington, NJ Electrochemical Society 01.11.1993
• Subjects: 420500 - Engineering- Materials Testing; AIR POLLUTION; Applied sciences; CORROSIVE EFFECTS; DESIGN; DUSTS; ELECTRONIC EQUIPMENT; Electronics; ENGINEERING; Exact sciences and technology; FLOW RATE; INDOOR AIR POLLUTION; MATERIALS TESTING; PARTICLE SIZE; POLLUTION; SIZE; TEST FACILITIES; TESTING; Testing, measurement, noise and reliability; Electronic equipment; Corrosive environment; Atmospheric particle; Indoor pollution; Electronic circuit; Experimental study; Reliability; Outdoor study; Atmospheric corrosion; Accelerated test

Airborne particles can severely degrade electronic equipment and systems by adhering to surfaces and then adsorbing moisture on the particle surface, which in turn captures corrosive gas molecules that form corrosive solutions that then attacks structures (wires, insulation, components, etc.). An ac...