Accelerated Life Testing of Electronic Devices by Atmospheric Particles: Why and How

Airborne particles can severely degrade electronic equipment and systems by adhering to surfaces and then adsorbing moisture on the particle surface, which in turn captures corrosive gas molecules that form corrosive solutions that then attacks structures (wires, insulation, components, etc.). An ac...

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Bibliographic Details
Published inJournal of the Electrochemical Society Vol. 140; no. 11; pp. 3129 - 3134
Main Authors Frankenthal, R. P., Siconolfi, D. J., Sinclair, J. D.
Format Journal Article
LanguageEnglish
Published Pennington, NJ Electrochemical Society 01.11.1993
Subjects
420500 - Engineering- Materials Testing
AIR POLLUTION
Applied sciences
CORROSIVE EFFECTS
DESIGN
DUSTS
ELECTRONIC EQUIPMENT
Electronics
ENGINEERING
Exact sciences and technology
FLOW RATE
INDOOR AIR POLLUTION
MATERIALS TESTING
PARTICLE SIZE
POLLUTION
SIZE
TEST FACILITIES
TESTING
Testing, measurement, noise and reliability
Electronic equipment
Corrosive environment
Atmospheric particle
Indoor pollution
Electronic circuit
Experimental study
Reliability
Outdoor study
Atmospheric corrosion
Accelerated test
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Summary:Airborne particles can severely degrade electronic equipment and systems by adhering to surfaces and then adsorbing moisture on the particle surface, which in turn captures corrosive gas molecules that form corrosive solutions that then attacks structures (wires, insulation, components, etc.). An accelerated life testing chamber subjects equipment to dust and ions at various velocity and humidity conditions. 32 refs.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0013-4651
1945-7111
DOI:10.1149/1.2220997