APA (7th ed.) Citation

Frankenthal, R. P., Siconolfi, D. J., & Sinclair, J. D. (1993). Accelerated Life Testing of Electronic Devices by Atmospheric Particles: Why and How. Journal of the Electrochemical Society, 140(11), 3129-3134. https://doi.org/10.1149/1.2220997

Chicago Style (17th ed.) Citation

Frankenthal, R. P., D. J. Siconolfi, and J. D. Sinclair. "Accelerated Life Testing of Electronic Devices by Atmospheric Particles: Why and How." Journal of the Electrochemical Society 140, no. 11 (1993): 3129-3134. https://doi.org/10.1149/1.2220997.

MLA (9th ed.) Citation

Frankenthal, R. P., et al. "Accelerated Life Testing of Electronic Devices by Atmospheric Particles: Why and How." Journal of the Electrochemical Society, vol. 140, no. 11, 1993, pp. 3129-3134, https://doi.org/10.1149/1.2220997.