Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation

Generally good agreement is obtained between the single-event output voltage transient waveforms obtained by exposing individual circuit elements of a bipolar comparator and operational amplifier to an ion microbeam, a pulsed laser beam, and circuit simulations using SPICE. The agreement is achieved...

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Bibliographic Details
Published inIEEE transactions on nuclear science Vol. 49; no. 6; pp. 3163 - 3170
Main Authors Pease, R.L., Sternberg, A.L., Boulghassoul, Y., Massengill, L.W., Buchner, S., McMorrow, D., Walsh, D.S., Hash, G.L., LaLumondiere, S.D., Moss, S.C.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.12.2002
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Beams (radiation)
Charge
Circuit simulation
Circuits
Laser beams
Lasers
Linear circuits
Microorganisms
Operational amplifiers
Optical pulses
Pulse amplifiers
Pulse circuits
Pulsed laser deposition
Simulation
SPICE
Spices
Voltage
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Summary:Generally good agreement is obtained between the single-event output voltage transient waveforms obtained by exposing individual circuit elements of a bipolar comparator and operational amplifier to an ion microbeam, a pulsed laser beam, and circuit simulations using SPICE. The agreement is achieved by adjusting the amounts of charge deposited by the laser or injected in the SPICE simulations. The implications for radiation hardness assurance are discussed.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2002.805346