Design and evaluation of quantum dot sensors for making superficial x-ray energy radiation measurements

The extraordinary physical properties of quantum dot (QD) materials such as high radiation sensitivity and good radiation resistivity indicate their potential for use in the fabrication of radiation sensors. This paper reports the design and fabrication of two kinds of radiation sensors based on ZnO...

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Bibliographic Details
Published inNanotechnology Vol. 21; no. 28; p. 285502
Main Authors Gao, X, Kang, Q S, Yeow, J T W, Barnett, R
Format Journal Article
LanguageEnglish
Published England IOP Publishing 16.07.2010
Subjects
Cadmium tellurides
Density
Electrodes
Irradiation
Linearity
Photons
Quantum dots
Sensors
X-rays
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Summary:The extraordinary physical properties of quantum dot (QD) materials such as high radiation sensitivity and good radiation resistivity indicate their potential for use in the fabrication of radiation sensors. This paper reports the design and fabrication of two kinds of radiation sensors based on ZnO and CdTe QDs. Both sensors are characterized using a Gulmay Medical D3000 DXR unit for superficial x-ray irradiation with source photon energies that range from 36.9 to 64.9 keV. The QD radiation sensors exhibit excellent linearity with respect to different photon energy doses, radiation source to device surface distances, and field sizes. The effects of the electrode separation and the area density of the QD layer are also investigated. All sensors characterized show an outstanding repeatability under photon irradiation, with a signal variation less than 1%.
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ISSN:0957-4484
1361-6528
DOI:10.1088/0957-4484/21/28/285502