Microstructure evolution and hardness variation during annealing of equal channel angular pressed ultra-fine grained nickel subjected to 12 passes
The microstructure, thermal stability and hardness of ultra-fine grained (UFG) Ni produced by 12 passes of equal channel angular pressing (ECAP) through the route Bc were studied. Comparing the microstructure and hardness of the as-ECAPed samples with the published data on UFG Ni obtained after 8 pa...
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Published in | Journal of materials science Vol. 46; no. 8; pp. 2662 - 2671 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
Boston
Springer US
01.04.2011
Springer Springer Nature B.V |
Subjects | |
Online Access | Get full text |
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Summary: | The microstructure, thermal stability and hardness of ultra-fine grained (UFG) Ni produced by 12 passes of equal channel angular pressing (ECAP) through the route Bc were studied. Comparing the microstructure and hardness of the as-ECAPed samples with the published data on UFG Ni obtained after 8 passes of ECAP through the route Bc reveals a smaller average grain size (230 nm in the present case compared with 270 nm in 8-pass Ni), significantly lower dislocation density (1.08 × 10
14
m
−2
compared with 9 × 10
14
m
−2
in 8-pass Ni) and lower hardness (2 GPa compared with 2.45 GPa for 8-pass Ni). Study of the thermal stability of the 12-pass UFG Ni revealed that recovery is dominant in the temperature range 150–250°C and recrystallisation occurred at temperatures >250 °C. The UFG microstructure is relatively stable up to about 400 °C. Due to the lower dislocation density and consequently a lower stored energy, the recrystallisation of 12-pass ECAP Ni occurred at a higher temperature (~250 °C) compared with the 8-pass Ni (~200 °C). In the 12-pass Nickel, hardness variation shows that its dependence on grain size is inversely linear rather than the common grain size
−0.5
dependence. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 0022-2461 1573-4803 |
DOI: | 10.1007/s10853-010-5122-z |