Noise Characterization in High-Areal Density Perpendicular and Shingled Magnetic Recording

• Published in: IEEE transactions on magnetics Vol. 50; no. 3; pp. 67 - 73
• Main Authors: Galbraith, Richard, Hanson, Weldon, Lengsfield, Byron, Oenning, Travis, Jihoon Park, Salo, Michael
• Format: Journal Article Conference Proceeding
• Language: English
• Published: New York, NY IEEE 01.03.2014; Institute of Electrical and Electronics Engineers; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: 2-D magnetic recording (TDMR); adjacent track erasure; channel modeling; Cross-disciplinary physics: materials science; rheology; Density; Electric breakdown; Electronics; Equations; Exact sciences and technology; Gain; Interference; Magnetic heads; Magnetic recording; Magnetic resonance imaging; Magnetism; Materials science; Media; Noise; noise analysis; Noise measurement; Other topics in materials science; pattern dependent noise predictive (PDNP); perpendicular magnetic recording (PMR); Physics; shingled magnetic recording (SMR); Variance; variance deconvolution; viterbi detection; variance deconvolution; channel modeling; shingled magnetic recording (SMR); adjacent track erasure; 2-D magnetic recording (TDMR); Density; perpendicular magnetic recording (PMR); noise analysis; Viterbi detection; pattern dependent noise predictive (PDNP); Modelling; Magnetic recording; Magnetic properties
• ISSN: 0018-9464; 1941-0069
• DOI: 10.1109/TMAG.2013.2291875

In this paper, we present a technique of noise analysis for perpendicular and shingled magnetic recording that is variance centric, i.e., with analysis focused on noise power. Measured noise from a home track viewpoint is decomposed into electronic noise, transition noise, nontransition noise, and inter-track interference components. The separation of media noise into transition and nontransition noise components is accomplished by a variance deconvolution technique. Experimental noise analysis is shown for cases of track squeeze, adjacent track erasure, and read head offset. Potential capacity gains are also assessed for the case of electronic noise improvement.