Probing the transverse magneto-optical Kerr effect at the nanoscale

This article presents a theoretical formalism for a magneto‐optical scanning near‐field microscope (MO‐SNOM) in the transverse magneto‐optical Kerr effect configuration. Polarized light emitted by a nanosource is scattered by the magnetic object towards the detector. The nanosource is modelled as a...

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Bibliographic Details
Published inPhysica status solidi. A, Applications and materials science Vol. 204; no. 6; pp. 1956 - 1961
Main Authors Alvarez-Prado, L.-M., Souche, Y., Carminati, R.
Format Journal Article Conference Proceeding
LanguageEnglish
Published Berlin WILEY-VCH Verlag 01.06.2007
WILEY‐VCH Verlag
Wiley-VCH
Wiley
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Summary:This article presents a theoretical formalism for a magneto‐optical scanning near‐field microscope (MO‐SNOM) in the transverse magneto‐optical Kerr effect configuration. Polarized light emitted by a nanosource is scattered by the magnetic object towards the detector. The nanosource is modelled as a circular aperture in an infinitely thin, perfectly conducting screen following the Bethe–Bouwkamp model. The theorem of reciprocity is used for calculating the detected signal in a constant‐height scanning mode for a Co thin film pattern. Two magnetic distributions are investigated: the single domain and the Bloch wall. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
Bibliography:istex:3824B18DE0D263277366B3BD7A355218E9C50825
ark:/67375/WNG-02FB2RZZ-J
Ministerio de Educación y Ciencia - No. MEC-05-FIS2005-07392-C02-01
ArticleID:PSSA200675353
ISSN:1862-6300
1862-6319
DOI:10.1002/pssa.200675353