Superconductor-Insulator transition in sputtered amorphous MoRu and MoRuN thin films

This work shows the experimental results of the superconductor-insulator (S-I) transition for amorphous molybdenum ruthenium (MoRu) and molybdenum ruthenium nitride (MoRuN) films. These amorphous films onto c-plane sapphire substrates have been interpreted to be homogeneous by XRD and AFM measuremen...

Full description

Saved in:
Bibliographic Details
Published inJournal of physics. Conference series Vol. 969; no. 1; pp. 12026 - 12031
Main Authors Makise, K, Shinozaki, B, Ichikawa, F
Format Journal Article
LanguageEnglish
Published Bristol IOP Publishing 01.03.2018
Subjects
Molybdenum
Morphology
Physics
Ruthenium
Sapphire
Substrates
Superconducting films
Superconductivity
Thin films
Online AccessGet full text

Cover

More Information
Summary:This work shows the experimental results of the superconductor-insulator (S-I) transition for amorphous molybdenum ruthenium (MoRu) and molybdenum ruthenium nitride (MoRuN) films. These amorphous films onto c-plane sapphire substrates have been interpreted to be homogeneous by XRD and AFM measurements. Electrical and superconducting properties measurements were carried out on MoRu and MoRuN thin films deposited by reactive sputtering technique. We have analysed the data on Rsq (T) based on excess conductivity of superconducting films by the AL and MT term and weak localization and electron-electron interaction for the conductance. MoRu films which offer the most homogeneous film morphology, showed a critical sheet resistance of transition, Rc, of ∼ 2 kΩ. This values is smaller than those previously our reported for quench-condensed MoRu films on SiO underlayer held at liquid He temperature.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/969/1/012026