Negative Differential Resistance of Graphene Oxide/Sulphur Compound

Graphene oxide/sulphur compound was synthesized by Hammers method. The chemical composition, presence/quantity of functional groups, exfoliation level, number of layers, crystallite size of graphene oxide/sulphur were characterized by X-ray diffraction, Raman spectroscopy, and scanning electron micr...

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Bibliographic Details
Published inJournal of nano research Vol. 67; pp. 25 - 31
Main Authors Abaszade, Rashad G., Figarova, Sophia R., Alekberov, R.I., Figarov, Vagif R., Aliyev, Elvin M.
Format Journal Article
LanguageEnglish
Published Zurich Trans Tech Publications Ltd 27.04.2021
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Summary:Graphene oxide/sulphur compound was synthesized by Hammers method. The chemical composition, presence/quantity of functional groups, exfoliation level, number of layers, crystallite size of graphene oxide/sulphur were characterized by X-ray diffraction, Raman spectroscopy, and scanning electron microscopy images. The current-voltage characteristics of the samples were measured in air at room temperature. In the I - V characteristic curve of graphene oxide/sulphur compound with the ratio of oxygen to carbon of 3.54 and that to sulphur of 42.54, negative differential resistance was observed. The negative differential resistance is attributed to current carrier transitions between the localized states formed by functional groups.
ISSN:1662-5250
1661-9897
1661-9897
DOI:10.4028/www.scientific.net/JNanoR.67.25