Nanographene charge trapping memory with a large memory window

• Published in: Nanotechnology Vol. 26; no. 45; p. 455704
• Main Authors: Meng, Jianling, Yang, Rong, Zhao, Jing, He, Congli, Wang, Guole, Shi, Dongxia, Zhang, Guangyu
• Format: Journal Article
• Language: English
• Published: England IOP Publishing 13.11.2015
• Subjects: Charge; Charge density; charge trapping memory; Durability; High density; Islands; nanographene; Nanostructure; plasma etching; Semiconductors; Trapping
• ISSN: 0957-4484; 1361-6528
• DOI: 10.1088/0957-4484/26/45/455704

Nanographene is a promising alternative to metal nanoparticles or semiconductor nanocrystals for charge trapping memory. In general, a high density of nanographene is required in order to achieve high charge trapping capacity. Here, we demonstrate a strategy of fabrication for a high density of nanographene for charge trapping memory with a large memory window. The fabrication includes two steps: (1) direct growth of continuous nanographene film; and (2) isolation of the as-grown film into high-density nanographene by plasma etching. Compared with directly grown isolated nanographene islands, abundant defects and edges are formed in nanographene under argon or oxygen plasma etching, i.e. more isolated nanographene islands are obtained, which provides more charge trapping sites. As-fabricated nanographene charge trapping memory shows outstanding memory properties with a memory window as wide as ∼9 V at a relative low sweep voltage of 8 V, program/erase speed of ∼1 ms and robust endurance of >1000 cycles. The high-density nanographene charge trapping memory provides an outstanding alternative for downscaling technology beyond the current flash memory.