Application of Scanning Capacitance Force Microscopy for Detecting Impurity Phases in Ferroelectric Triglycine Sulfate

An inhomogeneous ferroelectric (triglycine-sulfate (TGS) single crystal with a TGS–TGS+Cr periodic growth impurity structure) has been investigated by scanning capacitance force microscopy (SCFM). The specific features of mapping capacitance variations when detecting the electrostatic force at doubl...

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Bibliographic Details
Published inTechnical physics Vol. 64; no. 11; pp. 1602 - 1608
Main Authors Gainutdinov, R. V., Tolstikhina, A. L., Lashkova, A. K., Belugina, N. V., Shut, V. N., Mozzharov, S. E., Kashevich, I. F.
Format Journal Article
LanguageEnglish
Published Moscow Pleiades Publishing 01.11.2019
Springer
Springer Nature B.V
Subjects
Capacitance
Classical and Continuum Physics
Crystal structure
Domain walls
Ferroelectric materials
Ferroelectricity
Impurities
Mapping
Microscope and microscopy
Microscopy
Physics
Physics and Astronomy
Piezoelectricity
Resonance
Single crystals
Sulfates
Triglycine sulfate
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Summary:An inhomogeneous ferroelectric (triglycine-sulfate (TGS) single crystal with a TGS–TGS+Cr periodic growth impurity structure) has been investigated by scanning capacitance force microscopy (SCFM). The specific features of mapping capacitance variations when detecting the electrostatic force at double and triple resonance frequencies are considered. The piezoelectric response, surface potential, and surface topography have been measured. It is shown that the capacitance contrast is formed both on domain walls and on TGS and TGS+Cr stripes. It is demonstrated that SCFM at the electrostatic-force double resonance frequency makes it possible to observe the spatial impurity distribution in the ferroelectric structure in the range of Cr concentrations of about 0.02–0.08 wt %.
ISSN:1063-7842
1090-6525
DOI:10.1134/S1063784219110094