Solid state properties of thin films of new copoly(azomethine-sulfone)s

• Published in: Journal of applied polymer science Vol. 120; no. 3; pp. 1720 - 1728
• Main Authors: Marin, Luminita, Timpu, Daniel, Cozan, Vasile, Rusu, Gheorghe I, Airinei, Anton
• Format: Journal Article
• Language: English
• Published: Hoboken Wiley Subscription Services, Inc., A Wiley Company 05.05.2011; Wiley; Wiley Subscription Services, Inc
• Subjects: Applied sciences; atomic force microscopy; charge transport; Correlation; Diffraction; Exact sciences and technology; Matching; Materials science; mesomorphism; morphology; Organic polymers; Physicochemistry of polymers; polyimines; Polymers; Polymers with particular properties; Preparation, kinetics, thermodynamics, mechanism and catalysts; Reproduction; Spontaneous; Thermal properties; Thermogravimetric analysis; Thin films; Electrical conductivity; Solution polycondensation; Electrical properties; Thermotropic state; Mesomorphic state structure; Experimental study; atomic force microscopy; Sulfone copolymer; Phase transitions; charge transport; Conducting polymers; Thermal properties; mesomorphism; Liquid crystal polymers; Morphology; Preparation; Organic semiconductors; Schiff base copolymer; polyimines
• ISSN: 0021-8995; 1097-4628; 1097-4628
• DOI: 10.1002/app.33313

A series of four copoly(azomethine-sulfone)s have been synthesized and extensively characterized. The chemical design has been thought to obtain semiconducting properties and thermotropic behavior matching the processing of the materials from the ordered melted state, suitable for the spontaneous alignment of molecules in the active layer on a substrate. Prototypes of thin films based on this series of polymers have been electrically and structurally characterized. It was found that the respective polymers show typical semiconducting properties. The thermal properties with particular reference to their mesomorphic state were checked by using differential scanning calorimetry, polarized light microscopy, and thermogravimetric analysis techniques. Morphological characterization was realized by atomic force microscopy and X-ray diffraction measurements. Some correlations between electrical properties and packing closeness were established.