Metrological evaluation of Microsoft Kinect and Asus Xtion sensors

• Published in: Measurement : journal of the International Measurement Confederation Vol. 46; no. 6; pp. 1800 - 1806
• Main Authors: Gonzalez-Jorge, H., Riveiro, B., Vazquez-Fernandez, E., Martínez-Sánchez, J., Arias, P.
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 01.07.2013
• Subjects: 3D sensing device; Aluminum; Mathematical analysis; Metrology; Optical metrology; Polynomials; Sensors; Standard artifact; Three dimensional; 3D sensing device; Standard artifact; Optical metrology
• ISSN: 0263-2241; 1873-412X
• DOI: 10.1016/j.measurement.2013.01.011

► We develop the geometric verification of Kinect and Xtion sensors. ► We use a low-cost mechanical calibration standard for that purpose. ► Kinect and Xtion demonstrate their feasibility for accurate 3D measurements. In recent months Kinect and Xtion sensors appear massively at the entertainment market. In parallel, many developers show engineering applications of the system related with their 3D imaging possibilities. In this work a metrological geometric verification of the systems is performed using a standard artifact which consists of five delrin spheres and seven aluminum cubes. Accuracy and precision tests show non-dependence with the type of sensor (two Kinect and one Xtion are used for the experiment) or with the incident angle between the standard artifact and the sensor (45°, 90° and 135°). Precision decreases with range according to a second order polynomial equation. Ranges larger than 7m cannot provide any measurement. Accuracy data change from 5mm to −15mm for 1m range and from 5mm to −25mm for 2m range. Precision data change from 1mm to 6mm for 1m range and from 4mm to 14mm for 2m range. The results confirm that these sensors can be used in many engineering applications when the measurement range is short and accuracy requirements are not very strict.