Cu/SiO2 catalyst prepared by electroless method
Cu/SiO2 catalysts prepared by an electroless deposition method were investigated and compared with those by an impregnation method. Copper contents varied from 5% to 15% and SiO2 was used as support. All catalysts were characterized by BET, DSC, SEM and TPR and tested by an n‐butanol dehydrogenation...
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Published in | Journal of chemical technology and biotechnology (1986) Vol. 73; no. 4; pp. 414 - 420 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
Chichester, UK
John Wiley & Sons, Ltd
01.12.1998
Wiley |
Subjects | |
Online Access | Get full text |
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Summary: | Cu/SiO2 catalysts prepared by an electroless deposition method were investigated and compared with those by an impregnation method. Copper contents varied from 5% to 15% and SiO2 was used as support. All catalysts were characterized by BET, DSC, SEM and TPR and tested by an n‐butanol dehydrogenation reaction for activities and stabilities. BET analysis showed that the catalysts prepared by the two methods present larger average pore size and less surface area than those of the fresh SiO2, indicating that smaller pores may get blocked during the course of preparation. This blockage is more severe in the impregnation method. SEM photos showed that the electroless method produces smaller copper crystals than the impregnated method. The reaction activity was found to be in the order of the calcined electroless copper catalyst>the fresh electroless copper catalyst>impregnated copper catalyst. © 1998 Society of Chemical Industry |
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Bibliography: | National Science Council of the Republic of China - No. NSC84-2214-E011-005 ArticleID:JCTB965 istex:731B8B3CC0875993CACA61C77563797A7C71B211 ark:/67375/WNG-FVTFGV6M-S |
ISSN: | 0268-2575 1097-4660 |
DOI: | 10.1002/(SICI)1097-4660(199812)73:4<414::AID-JCTB965>3.0.CO;2-X |