Write/Erase Cyclability of TbFeCo for Mark-Edge Recording

Write/erase cyclability for mark-edge recording is studied using rare-earth element[RE]-rich TbFeCo media. Mark-edge jitter for the (1-7) random pattern is small enough even after millions of cycles of data writing and erasing.

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Bibliographic Details
Published inJPN J APPL PHYS PART 1 REGUL PAP SHORT NOTE REV PAP Vol. 32; no. 11B; pp. 5441 - 5442
Main Authors YSOHIHIRO, M, SHIMAZAKI, K, OHTA, N, TODA, T, AWANO, H, OJIMA, M
Format Conference Proceeding Journal Article
LanguageEnglish
Published Tokyo Japanese journal of applied physics 01.11.1993
Subjects
Applied sciences
Electronics
Exact sciences and technology
Magnetic and optical mass memories
Storage and reproduction of information
Jitter
Recording material
Optical recording
High density
Optical memory
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Summary:Write/erase cyclability for mark-edge recording is studied using rare-earth element[RE]-rich TbFeCo media. Mark-edge jitter for the (1-7) random pattern is small enough even after millions of cycles of data writing and erasing.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
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ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.32.5441