Simultaneous measurement of static and kinetic friction of ZnO nanowires in situ with a scanning electron microscope

► ZnO nanowires are manipulated on oxidised silicon inside scanning electron microscope. ► The elastic deformation of a manipulated nanowire was used to determine the distributed static and kinetic friction force. ► In similar way fracture tensile stress was calculated for a broken nanowire. A novel...

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Published inMicron (Oxford, England : 1993) Vol. 43; no. 11; pp. 1140 - 1146
Main Authors Polyakov, Boris, Dorogin, Leonid M., Vlassov, Sergei, Kink, Ilmar, Romanov, Alexey E., Lohmus, Rynno
Format Journal Article
LanguageEnglish
Published England Elsevier Ltd 01.11.2012
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Summary:► ZnO nanowires are manipulated on oxidised silicon inside scanning electron microscope. ► The elastic deformation of a manipulated nanowire was used to determine the distributed static and kinetic friction force. ► In similar way fracture tensile stress was calculated for a broken nanowire. A novel method for in situ measurement of the static and kinetic friction is developed and demonstrated for zinc oxide nanowires (NWs) on oxidised silicon wafers. The experiments are performed inside a scanning electron microscope (SEM) equipped with a nanomanipulator with an atomic force microscope tip as a probe. NWs are pushed by the tip from one end until complete displacement is achieved, while NW bending is monitored by the SEM. The elastic bending profile of a NW during the manipulation process is used to calculate the static and kinetic friction forces.
Bibliography:http://dx.doi.org/10.1016/j.micron.2012.01.009
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ISSN:0968-4328
1878-4291
DOI:10.1016/j.micron.2012.01.009