Simultaneous measurement of static and kinetic friction of ZnO nanowires in situ with a scanning electron microscope
► ZnO nanowires are manipulated on oxidised silicon inside scanning electron microscope. ► The elastic deformation of a manipulated nanowire was used to determine the distributed static and kinetic friction force. ► In similar way fracture tensile stress was calculated for a broken nanowire. A novel...
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Published in | Micron (Oxford, England : 1993) Vol. 43; no. 11; pp. 1140 - 1146 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
England
Elsevier Ltd
01.11.2012
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Subjects | |
Online Access | Get full text |
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Summary: | ► ZnO nanowires are manipulated on oxidised silicon inside scanning electron microscope. ► The elastic deformation of a manipulated nanowire was used to determine the distributed static and kinetic friction force. ► In similar way fracture tensile stress was calculated for a broken nanowire.
A novel method for in situ measurement of the static and kinetic friction is developed and demonstrated for zinc oxide nanowires (NWs) on oxidised silicon wafers. The experiments are performed inside a scanning electron microscope (SEM) equipped with a nanomanipulator with an atomic force microscope tip as a probe. NWs are pushed by the tip from one end until complete displacement is achieved, while NW bending is monitored by the SEM. The elastic bending profile of a NW during the manipulation process is used to calculate the static and kinetic friction forces. |
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Bibliography: | http://dx.doi.org/10.1016/j.micron.2012.01.009 ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 ObjectType-Article-2 ObjectType-Feature-1 |
ISSN: | 0968-4328 1878-4291 |
DOI: | 10.1016/j.micron.2012.01.009 |