Frequency Pulling and the Linewidth Enhancement Factor in Optically Injected Semiconductor Laser

The effect of the linewidth enhancement factor (LEF) on the frequency pulling behavior in optically injected lasers is theoretically investigated. The frequency pulling is found to be exponentially dependent on the LEF. This dependence is systematically revealed and explained.

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Bibliographic Details
Published inPhotonics Vol. 9; no. 11; p. 866
Main Author Al-Hosiny, Najm M.
Format Journal Article
LanguageEnglish
Published Basel MDPI AG 01.11.2022
Subjects
Bandwidths
Electric fields
Frequency pulling
Investigations
Lasers
linewidth enhancement factor
optical injection
Oscillators
Semiconductor lasers
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Summary:The effect of the linewidth enhancement factor (LEF) on the frequency pulling behavior in optically injected lasers is theoretically investigated. The frequency pulling is found to be exponentially dependent on the LEF. This dependence is systematically revealed and explained.
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ISSN:2304-6732
2304-6732
DOI:10.3390/photonics9110866