Room-temperature nonlinear Hall effect and wireless radiofrequency rectification in Weyl semimetal TaIrTe4
The nonlinear Hall effect (NLHE), the phenomenon in which a transverse voltage can be produced without a magnetic field, provides a potential alternative for rectification or frequency doubling 1 , 2 . However, the low-temperature detection of the NLHE limits its applications 3 , 4 . Here, we report...
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Published in | Nature nanotechnology Vol. 16; no. 4; pp. 421 - 425 |
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Main Authors | , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
London
Nature Publishing Group UK
01.04.2021
Nature Publishing Group |
Subjects | |
Online Access | Get full text |
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Summary: | The nonlinear Hall effect (NLHE), the phenomenon in which a transverse voltage can be produced without a magnetic field, provides a potential alternative for rectification or frequency doubling
1
,
2
. However, the low-temperature detection of the NLHE limits its applications
3
,
4
. Here, we report the room-temperature NLHE in a type-II Weyl semimetal TaIrTe
4
, which hosts a robust NLHE due to broken inversion symmetry and large band overlapping at the Fermi level. We also observe a temperature-induced sign inversion of the NLHE in TaIrTe
4
. Our theoretical calculations suggest that the observed sign inversion is a result of a temperature-induced shift in the chemical potential, indicating a direct correlation of the NLHE with the electronic structure at the Fermi surface. Finally, on the basis of the observed room-temperature NLHE in TaIrTe
4
we demonstrate the wireless radiofrequency (RF) rectification with zero external bias and magnetic field. This work opens a door to realizing room-temperature applications based on the NLHE in Weyl semimetals.
Broken inversion symmetry in a type-II Weyl semimetal TaIrTe
4
enables observation of the room-temperature nonlinear Hall effect as well as wireless radiofrequency rectification. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 content type line 23 |
ISSN: | 1748-3387 1748-3395 1748-3395 |
DOI: | 10.1038/s41565-020-00839-3 |