Femtosecond time-resolved photoemission electron microscopy operated at sample illumination from the rear side

• Published in: Review of scientific instruments Vol. 90; no. 5; pp. 053704 - 53710
• Main Authors: Klick, Alwin, Großmann, Malte, Beewen, Maria, Bittorf, Paul, Fiutowski, Jacek, Leißner, Till, Rubahn, Horst-Günter, Reinhardt, Carsten, Elmers, Hans-Joachim, Bauer, Michael
• Format: Journal Article
• Language: English
• Published: United States American Institute of Physics 01.05.2019
• Subjects: Electron microscopy; Excitation; Femtosecond pulsed lasers; Illumination; Incidence; Microscopy; Photoelectric emission; Polaritons; Scientific apparatus & instruments

We present an advanced experimental setup for time-resolved photoemission electron microscopy (PEEM) with sub-20 fs resolution, which allows for normal incidence and highly local sample excitation with ultrashort laser pulses. The scheme makes use of a sample rear side illumination geometry that ena...