Femtosecond time-resolved photoemission electron microscopy operated at sample illumination from the rear side

• Published in: Review of scientific instruments Vol. 90; no. 5; pp. 053704 - 53710
• Main Authors: Klick, Alwin, Großmann, Malte, Beewen, Maria, Bittorf, Paul, Fiutowski, Jacek, Leißner, Till, Rubahn, Horst-Günter, Reinhardt, Carsten, Elmers, Hans-Joachim, Bauer, Michael
• Format: Journal Article
• Language: English
• Published: United States American Institute of Physics 01.05.2019
• Subjects: Electron microscopy; Excitation; Femtosecond pulsed lasers; Illumination; Incidence; Microscopy; Photoelectric emission; Polaritons; Scientific apparatus & instruments
• ISSN: 0034-6748; 1089-7623; 1089-7623
• DOI: 10.1063/1.5088031

We present an advanced experimental setup for time-resolved photoemission electron microscopy (PEEM) with sub-20 fs resolution, which allows for normal incidence and highly local sample excitation with ultrashort laser pulses. The scheme makes use of a sample rear side illumination geometry that enables us to confine the sample illumination spot to a diameter as small as 6 µm. We demonstrate an operation mode in which the spatiotemporal dynamics following a highly local excitation of the sample is globally probed with a laser pulse illuminating the sample from the front side. Furthermore, we show that the scheme can also be operated in a time-resolved normal incidence two-photon PEEM mode with interferometric resolution, a technique providing a direct and intuitive real-time view onto the propagation of surface plasmon polaritons.