Determination of the Sb/Si(111) interfacial structure by back-reflection x-ray standing waves and surface extended x-ray-absorption fine structure

Saved in:
Bibliographic Details
Published inPhysical review. B, Condensed matter Vol. 44; no. 7; p. 3475
Main Authors Woicik, JC, Kendelewicz, T, Miyano, KE, Cowan, PL, Bouldin, CE, Karlin, BA, Pianetta, P, Spicer, WE
Format Journal Article
LanguageEnglish
Published United States 15.08.1991
Online AccessGet more information

Cover

More Information
ISSN:0163-1829
DOI:10.1103/physrevb.44.3475