An experimental UHV AFM-STM device for characterizing surface nanostructures under stress/strain at variable temperature

• Published in: Review of scientific instruments Vol. 84; no. 10; p. 105117
• Main Authors: Nahas, Y, Berneau, F, Bonneville, J, Coupeau, C, Drouet, M, Lamongie, B, Marteau, M, Michel, J, Tanguy, P, Tromas, C
• Format: Journal Article
• Language: English
• Published: United States 01.10.2013
• ISSN: 1089-7623
• DOI: 10.1063/1.4826555

A compression setup fully integrated in an ultra high vacuum chamber is presented. The system has been designed to combine in situ mechanical test together with near field microscopy at variable temperature, from 90 to 600 K. Compressive stress can be applied on the samples up to 500 MPa at different strain rates ranging from 10(-6) s(-1) to 10(-2) s(-1). The setup performances are highlighted through investigations on Au and Ni3(Al,Ta) single crystals. In particular, it is demonstrated that the high mechanical stability of the original apparatus allows us to follow in situ the evolution of the same area of interest over a large range of temperature and to keep the high spatial resolution offered by near field microscopy, even at high strain levels.