Volume Fraction and Whisker Orientation Dependence of the Electrical Properties of SiC-Whisker-Reinforced Mullite Composites

The electrical behavior of hot‐pressed mullite composites reinforced with 10, 20, and 30% SiC whiskers (SiCw) was evaluated in the frequency range 100 Hz–10 MHz and compared with 2 GHz data as well as dc resistivity measurements. It is found that the addition of SiCw has a dramatic effect on the die...

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Published inJournal of the American Ceramic Society Vol. 84; no. 10; pp. 2328 - 2334
Main Authors Gerhardt, Rosario A., Ruh, Robert
Format Journal Article
LanguageEnglish
Published Westerville, Ohio American Ceramics Society 01.10.2001
Blackwell
Subjects
Applied sciences
Building materials. Ceramics. Glasses
Ceramic industries
Chemical industry and chemicals
dielectric properties
Exact sciences and technology
mullite
silicon carbide
Structural ceramics
Technical ceramics
Aluminium Silicates
Volume fraction
Electrical properties
Dielectric properties
Fiber reinforced material
Experimental study
Composite material
Whisker
Structural ceramic
Hot pressing
Silicon Carbides
Sintering
Mullite
Fiber orientation
Manufacturing
Microstructure
Electrical impedance
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Summary:The electrical behavior of hot‐pressed mullite composites reinforced with 10, 20, and 30% SiC whiskers (SiCw) was evaluated in the frequency range 100 Hz–10 MHz and compared with 2 GHz data as well as dc resistivity measurements. It is found that the addition of SiCw has a dramatic effect on the dielectric properties as well as the resistivity of these materials. The ac properties (dielectric constant, dielectric loss, and impedance) show a strong dependence on the volume fraction of SiC and on the orientation of the electric field with respect to the hot‐pressing direction and hence the whisker orientation. The dc resistivity measurements are sensitive to the whisker volume fraction but cannot easily discriminate between those samples that were measured parallel or perpendicular to the hot‐pressing direction as was possible with the ac measurements.
Bibliography:istex:771F0DC924D0C99148E1B32C59E71950AC201416
ArticleID:JACE2328
ark:/67375/WNG-P7GJBCR7-D
Presented in part at the 92nd Annual Meeting of the American Ceramic Society, Dallas, TX, April 25, 1990 (Electronics Division Paper 102‐E‐90).
One of the authors (R.G.) would like to acknowledge the financial support from the Center for Ceramic Research while at Rutgers University and under NASA Grant No. NAG3‐1559 at Georgia Tech.
Member, American Ceramic Society.
N. J. Dudney—contributing editor
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ISSN:0002-7820
1551-2916
DOI:10.1111/j.1151-2916.2001.tb01010.x