Method for the improvement of lateral resolution in stimulated emission depletion microscopy using a pupil filter

We present a simple method to improve the lateral resolution of stimulated emission depletion microscopy. In stimulated emission depletion microscopy, a saturated zero-centred spot is usually used to achieve a high lateral resolution. Using a half-coated phase plate, a zero-centred spot was made wit...

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Published inMeasurement science & technology Vol. 18; no. 8; pp. N61 - N64
Main Authors Yoo, Hongki, Song, Incheon, Kim, Taehoon, Gweon, Dae-Gab
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.08.2007
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Summary:We present a simple method to improve the lateral resolution of stimulated emission depletion microscopy. In stimulated emission depletion microscopy, a saturated zero-centred spot is usually used to achieve a high lateral resolution. Using a half-coated phase plate, a zero-centred spot was made with a narrow and steep gap at the centre. Numerical and experimental results show that by simply inserting a central obstacle as a pupil filter, it is possible to reduce the central gap of the zero-centred spot. Thus we can get a higher lateral resolution, although this sacrifices light efficiency.
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ISSN:0957-0233
1361-6501
DOI:10.1088/0957-0233/18/8/N01