Improving the reliability of electronic paper display using FMEA and Taguchi methods: A case study

• Published in: Microelectronics and reliability Vol. 54; no. 6-7; pp. 1369 - 1377
• Main Authors: Su, Chao-Ton, Lin, Hung-Chun, Teng, Po-Wen, Yang, Taho
• Format: Journal Article
• Language: English
• Published: Kidlington Elsevier Ltd 01.06.2014; Elsevier
• Subjects: Applied sciences; Display; Electronic paper; Electronics; Exact sciences and technology; Failure; Liquid crystal displays; Markets; Mass production; Readers; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Taguchi methods; Transistors; Trial and error methods; Display equipment; Performance evaluation; Mass production; New product; Electronic book; Scheduling; Failure mode and effect analysis; Failures; Energy savings; Implementation; Mean time between failures; Case study; Electronic paper; Electrophoresis; Liquid crystal displays; Delay time; Thin film transistor; Reliability; Flat panel displays; Taguchi method
• ISSN: 0026-2714; 1872-941X
• DOI: 10.1016/j.microrel.2014.02.015

•Considering the design and manufacturing issues simultaneously is crucial.•A combined method integrating FMEA and Taguchi methods has been proposed.•A real case of electronic paper display applying the proposed method was shown.•The case company has effectively improved the MTBF from 1867 to 4852h. The increase of e-book readers in recent years has driven the rapid growth of the application market of the electronic paper. The electronic paper is gradually regarded as a substitute for conventional papers because of its suitability for lengthy reading and for energy saving. However, the second generation electronic paper display (EPD) proved to be unreliable in a high-stress environment test, and failed to meet the requirement for mass production. Generally, adjusting the parameters through the trial and error method can delay the development schedule of the new product. Therefore, this study proposes a combined approach integrating failure mode and effect analysis (FMEA) and Taguchi methods to improve the reliability of the thin-film transistor liquid crystal display products. Considering the issues during design and manufacturing phases simultaneously, the proposed approach provides a systematic framework to find the causes of failure, to conduct experiments, and to optimize the process output. The actual case study demonstrates the effectiveness of the proposed approach in improving the EPD reliability. The implementation results show that the mean time between failures has improved from 1867 to 4852h and the development period has shortened by more than half a year. Further, the case company has earned revenues of approximately $800,000 by fulfilling a rush order.